The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Oct. 02, 2020
Applicant:

Uniwersytet Warszawski, Warsaw, PL;

Inventors:

Mateusz Goryca, Radom, PL;

Aleksander Bogucki, Warsaw, PL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/32 (2006.01); G01R 33/30 (2006.01);
U.S. Cl.
CPC ...
G01R 33/323 (2013.01); G01R 33/30 (2013.01);
Abstract

The invention is related to a sample holder for measurements of optically detected magnetic resonance, including a bottom plate, a top plate and a middle plate, wherein all the plates are made of a dielectric material. The top plate is provided with at least one top opening, enabling continuous optical access to the studied sample during measurements. The sample is placed in the central opening provided in the middle plate. The non-magnetic conductive strips provided on the surfaces of the bottom plate, the middle plate and the top plate ensure formation of an electrical circuit, which allows coupling of the studied sample with the generated microwave radiation to be achieved once the microwave sources is switched on. The invention also includes a sample holder for measurements of optically detected magnetic resonance, enabling formation of at least one loop of the electrical circuit.


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