The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Mar. 29, 2021
Applicant:

Sma Solar Technology Ag, Niestetal, DE;

Inventors:

Mathias Buenemann, Kassel, DE;

Matthias Groene, Kassel, DE;

Assignee:

SMA Solar Technology AG, Niestetal, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/67 (2020.01); G01R 31/69 (2020.01); H02J 3/00 (2006.01); H02J 3/26 (2006.01); H02J 13/00 (2006.01); G01R 19/25 (2006.01);
U.S. Cl.
CPC ...
G01R 31/67 (2020.01); H02J 13/00002 (2020.01); G01R 19/2513 (2013.01); G01R 31/69 (2020.01); H02J 3/00 (2013.01); H02J 3/26 (2013.01); H02J 13/00004 (2020.01); H02J 13/00006 (2020.01); Y02E 40/50 (2013.01); Y04S 10/50 (2013.01);
Abstract

A method for identifying an assignment of phase lines of an electrical distribution grid to connections of an electrical device capable of unbalanced-load operation, wherein the device is connected to a plurality of phase lines of the electrical distribution grid, includes setting target parameters assigned to an unbalanced load profile at each of the connections of the electrical device, detecting a temporal profile of a measurement parameter on each of the plurality of phase lines using a detection circuit, comparing the detected temporal profiles of the measurement parameters with the target parameters of the unbalanced load profile for each of the plurality of phase lines, respectively, and identifying the assignment of the phase lines to the connections on the basis of the comparison.


Find Patent Forward Citations

Loading…