The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Jan. 29, 2021
Thales, Courbevoie, FR;
Philippe Guichard, Valence, FR;
Jean-Pierre Schlotterbeck, Valence, FR;
Frédéric Sahliger, Valence, FR;
Jean-Claude Bourland, Valence, FR;
Philippe Rondeau, Valence, FR;
THALES, Courbevoie, FR;
Abstract
The present invention relates to a method for self-testing an angle-of-attack probe comprising the steps of controlling an angular excitation of a rotary element that is rotatable about its equilibrium position according to known excitation characteristics; acquiring angular measurements relating to the rotation of the rotary element, determining a parasitic torque applied to the rotary element on the basis of the angular measurements and of the excitation characteristics; comparing at least one component of the parasitic torque with at least one predetermined threshold and detecting an operating fault in the probe when said component exceeds the predetermined threshold.