The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Sep. 15, 2020
Applicant:

Jfe Steel Corporation, Tokyo, JP;

Inventors:

Masaki Kobayashi, Tokyo, JP;

Koji Yamashita, Tokyo, JP;

Kouyou Miyawaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/265 (2006.01); G01N 29/24 (2006.01); G01N 33/20 (2019.01);
U.S. Cl.
CPC ...
G01N 29/265 (2013.01); G01N 29/2493 (2013.01); G01N 33/20 (2013.01);
Abstract

A moving inspection device inspecting an inspection target while realizing the simplification of the configuration and significant size reduction/weight reduction of the device, a moving inspection method, and a method for manufacturing a steel material. The device includes a moving inspection device body configured to inspect an inspection target for defects while moving over its surface. The moving inspection device body includes: a carriage that moves by at least two wheels that rotate forward and backward over the surface; and at least one inspection sensor on the front end side or the rear end side of the carriage. An inspection region of the inspection target is divided into two divided regions across a straight line, and the carriage is configured to move when the inspection sensor is directed to side edges sides of the divided regions facing the straight line in each of the two divided regions.


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