The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Aug. 26, 2022
Konica Minolta, Inc., Tokyo, JP;
Hiroshi Morita, Narashino, JP;
Katsunori Teshima, Kokubunji, JP;
Mitsuru Mimori, Hino, JP;
Yoshiyuki Hashimoto, Hachioji, JP;
Motonori Takakura, Sagamihara, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
A measurement method is provided for non-destructive inspection of a magnetic material as an inspection target in a non-magnetic body. The method includes application of a magnetic field from a magnetic field applying unit to the inspection target through a surface of the non-magnetic body, and measurement of a magnetic field from the inspection target with a magnetic sensor on the surface of the non-magnetic body adjacent to the magnetic field applying unit at positions having different distances from the magnetic field applying unit in a first direction away from the magnetic field applying unit. The magnetic field from the inspection target is attenuated with the distances. In the method, first and second measurements are performed with the magnetic field applying unit respectively arranged on one side and on the other side in the first direction relative to the positions where the magnetic sensor performs measurement.