The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Jan. 18, 2019
Applicant:

University of Pittsburgh—of the Commonwealth System of Higher Education, Pittsburgh, PA (US);

Inventors:

Hongqiang Ma, Pittsburgh, PA (US);

Yang Liu, Sewickley, PA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G02B 21/16 (2013.01); G02B 21/367 (2013.01); G06T 7/97 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01);
Abstract

A background correction method for a fluorescence microscopy system includes receiving a raw image stack, determining a number of temporal minimum intensity values for each pixel location from the raw image stack, and calculating an expected background value for each pixel location based on the number of temporal minimum intensity values for the pixel location. Also, an emitter localization method includes receiving a raw image stack, determining a rough position of each of a plurality of emitters within the raw image stack by employing a linear deconvolution process, and determining a precise position of each of the plurality of emitters by employing the rough position of the emitter and gradient fitting.


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