The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
May. 16, 2022
Illumina, Inc., San Diego, CA (US);
Yinghua Sun, Foster City, CA (US);
Stanley S. Hong, Palo Alto, CA (US);
Frederick Erie, Carlsbad, CA (US);
Alex Nemiroski, San Diego, CA (US);
M. Shane Bowen, Encinitas, CA (US);
Danilo Condello, San Francisco, CA (US);
Dietrich Dehlinger, San Francisco, CA (US);
Marco A. Krumbuegel, San Ramon, CA (US);
Anthony Lam, Fremont, CA (US);
Aaron Liu, Irvine, CA (US);
Bojan Obradovic, Carlsbad, CA (US);
Mark Pratt, Belmont, CA (US);
Illumina, Inc., San Diego, CA (US);
Abstract
A system includes: an objective lens; a first light source to feed first illuminating light through the objective lens and into a flowcell (e.g., with a relatively thin film waveguide) to be installed in the system, the first illuminating light to be fed using a first grating on the flowcell; and a first image sensor to capture imaging light using the objective lens, wherein the first grating is positioned outside a field of view of the first image sensor. Dual-surface imaging can be performed. Flowcells with multiple swaths bounded by gratings can be used. An auto-alignment process can be performed.