Super resolution time domain spectroscopy method and device for sample characterization

Abstract

A method for determining a set of physical parameters of a sample, comprising the steps of: —A Retrieving a measured sample temporal trace Es(t), —B retrieving a measured reference temporal trace Eref(t), —C determining an widened reference temporal trace, called Eref0(t), and determining a discrete Fourier transform {hacek over (E)}(ω) of the widened reference temporal trace—D determining a modeling of an impulse response of the sample in the frequency domain, depending on the set of physical parameters (pi), called sample frequency model {hacek over (E)}{Pi}(ω), from the Fourier Transform of the widened reference temporal trace {hacek over (E)}(ω) and a physical behavior model of the sample, —E applying an optimization algorithm on the set of physical parameters (pi) comprising the sub steps of: —Einitializing physical parameters (pi), —realizing iteratively the sub steps of: —Ecalculating an inverse discrete Fourier transform of the sample frequency model {hacek over (E)}{Pi}(ω), called estimated sample temporal trace E{Pi}(t), —Ecalculating an error function (ε{pi}), until obtaining a set of values (pi) of physical parameters minimizing said error function.