The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Aug. 13, 2021
Applicant:
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Inventors:
Jacob Chamoun, Stanford, CA (US);
Michael I. Recht, San Carlos, CA (US);
Joerg Martini, San Francisco, CA (US);
Anne Plochowietz, Mountain View, CA (US);
Assignee:
Xerox Corporation, Norwalk, CT (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 11/12 (2021.01); G01K 11/165 (2021.01);
U.S. Cl.
CPC ...
G01K 11/12 (2013.01); G01K 11/165 (2013.01);
Abstract
Methods and systems for measuring the temperature of a sample can include the use of one or more illumination sources and a sample containing thermochromic material. One or more detectors are operable to detect two or more signals indicative of a component of an illumination facilitated by the illumination source(s) and scattered at two or more angles with respect to the sample containing the thermochromic material, wherein the signals are converted to a temperature.