The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Jul. 27, 2020
Applicant:

Safran, Paris, FR;

Inventors:

Nassim Salhi, Moissy-Cramayel, FR;

Minh Chau Phan Huy, Moissy-Cramayel, FR;

Ioannis Stasinopoulos, Moissy-Cramayel, FR;

Assignee:

SAFRAN, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01H 9/00 (2006.01);
U.S. Cl.
CPC ...
G01H 9/004 (2013.01);
Abstract

A measuring device including a measuring equipment that is configured to be optically interrogated by a measuring instrument with first optical signals in a first wavelength range, and a connecting optical fibre for optically connecting a measuring equipment to a measuring instrument. The connecting optical fibre includes at least a first optical core that is multimode in the first wavelength range and a second optical core that is single-mode in a second wavelength range. The connecting optical fibre includes at least one first segment of functionalised optical fibre that is such as to exhibit, at the second wavelength, and optical property that varies with an environmental parameter of the connecting optical fibre. The invention also relates to a measuring assembly and to an apparatus that includes such a measuring assembly.


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