The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Feb. 21, 2019
Applicant:

Ceva Technologies, Inc., Mountain View, CA (US);

Inventors:

Yun Li, Mountain View, CA (US);

Bryan A. Cook, Silver Spring, MD (US);

Chao Wu, Clarksville, MD (US);

Assignee:

CEVA TECHNOLOGIES, INC., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/20 (2006.01); G01C 17/28 (2006.01); G01C 17/38 (2006.01); G01C 19/00 (2013.01); G01P 15/08 (2006.01); G01P 15/18 (2013.01);
U.S. Cl.
CPC ...
G01C 21/20 (2013.01); G01C 17/28 (2013.01); G01C 17/38 (2013.01); G01C 19/00 (2013.01); G01P 15/08 (2013.01); G01P 15/18 (2013.01);
Abstract

Methods, apparatus, and systems directed to calibrating a magnetometer. Among such are methods that use only the horizontal components of magnetometer measurements. Then, planar calibrated magnetic field output measurements can be used in sensor fusion with data from gyroscope(s) and accelerometer(s). In other embodiments, heading information from the planar calibrated magnetic field is fused with the heading calculated from gyroscope integration. Other such methods include any of generating combined information including 6-axis fusion information and magnetometer information; accumulating values for any of a first matrix [T] and a first vector [U] according to the combined information; generating a second matrix [{circumflex over (K)}] according to any of a pseudo-inverse of the first matrix [T] and the first vector [U]; generating any of a scale and skew matrix and an offset according to the first matrix [{circumflex over (K)}]; and calibrating the magnetometer according to any of the scale and skew matrix and the offset.


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