The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Jan. 14, 2020
Applicant:

Eneos Corporation, Tokyo, JP;

Inventors:

Takashi Suzuki, Tokyo, JP;

Takashi Maeda, Tokyo, JP;

Mitsuo Karakane, Tokyo, JP;

Takahiro Shirai, Tokyo, JP;

Hiroshi Kawachi, Tokyo, JP;

Noriyuki Kiuchi, Tokyo, JP;

Assignee:

ENEOS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C01B 32/20 (2017.01); B01J 35/64 (2024.01); C01B 32/205 (2017.01); C01B 32/21 (2017.01); H01M 10/0525 (2010.01);
U.S. Cl.
CPC ...
C01B 32/205 (2017.08); B01J 35/647 (2024.01); C01B 32/21 (2017.08); H01M 10/0525 (2013.01); C01P 2004/51 (2013.01); C01P 2006/12 (2013.01);
Abstract

A synthetic graphite material, in which a size L () of a crystallite in a c-axis direction as calculated from a () diffraction line obtained by an X-ray wide angle diffraction method is in a range of 4 to 30 nm, a surface area based on a volume as calculated by a laser diffraction type particle size distribution measuring device is in a range of 0.22 to 1.70 m/cm, an oil absorption is in a range of 67 to 147 mL/100 g, a spectrum derived from carbon appearing in an electron spin resonance method as measured using an X band is in a range of 3200 to 3410 gauss, and ΔHpp, which is a line width of the spectrum as calculated from a first derivative spectrum of the spectrum at a temperature of 4.8K, is in a range of 41 to 69 gauss.


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