The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Feb. 11, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Satoshi Ikai, Yamanashi, JP;

Daisuke Uenishi, Yamanashi, JP;

Yuanming Xu, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23Q 17/12 (2006.01); B23Q 17/00 (2006.01); B23Q 17/10 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/12 (2013.01); B23Q 17/003 (2013.01); B23Q 17/10 (2013.01);
Abstract

A spindle vibration measuring system which measures vibration of a spindle in a machining device that performs a cutting or abrading process on a workpiece. The machining device has a workpiece holder that holds the workpiece, the spindle that holds a tool, and a moving mechanism that relatively moves the workpiece holder and the spindle. The spindle vibration measuring system acquires positional variation data or vibration data of the moving mechanism when the spindle rotates, and a result related to vibration of the spindle to output or store based on the positional variation data or the vibration data.


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