The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Feb. 28, 2020
Satake Corporation, Tokyo, JP;
Makoto Miyaji, Tokyo, JP;
Yoshihiro Tokui, Tokyo, JP;
SATAKE CORPORATION, Tokyo, JP;
Abstract
Provided is a monitoring system for a milling facility, which includes a plurality of grinders including roll mills for grinding a material to be milled and sifting machines for sifting, according to grain size, the material to be milled as ground by the roll mills; and a plurality of pulverizers including roll mills for pulverizing the material to be milled and sifting machines for sifting, according to grain size, the material to be milled as pulverized by the roll mills. The material to be milled is milled by each of the grinders and pulverizers. A plurality of flow rate measuring devices are provided on respective flow paths for product flours discharged from the respective sifting machines in the respective grinders and pulverizers, and a monitoring device capable of monitoring presence or absence of an abnormality based on measurement results on respective flow rates of the product flours is provided.