The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Apr. 10, 2020
Koninklijke Philips N.v., Eindhoven, NL;
Petrus Johannes Withagen, Halsteren, NL;
Erik Hummel, Eindhoven, NL;
Fred Simon Berend Van Nijnatten, Eindhoven, NL;
Joost Adrianus Van Rooijen, Best, NL;
Peter George Van De Haar, Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
An X-ray system comprises an assembly that is moveable to different scan coordinates to acquire X-ray projection images at the different scan coordinates in a dynamic mode while the assembly is moving. The assembly is also moveable to a predetermined reference coordinate to acquire an X-ray projection image at the predetermined reference coordinate in a static mode while the assembly is resting. The X-ray system also comprises a processor configured to obtain dynamic gain calibration parameters from the X-ray projection images acquired in the dynamic mode at one of the different scan coordinates; obtain a static gain calibration parameter from the X-ray projection image acquired in the static mode at the predetermined reference coordinate; and determine adjusted dynamic gain calibration parameters.