The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2024
Filed:
Feb. 05, 2021
Applicant:
Canon Medical Systems Corporation, Otawara, JP;
Inventors:
Kent C. Burr, Vernon Hill, IL (US);
Yi Qiang, Vernon Hill, IL (US);
Xiaoli Li, Vernon Hill, IL (US);
Assignee:
CANON MEDICAL SYSTEMS CORPORATION, Otawara, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/42 (2024.01); A61B 6/58 (2024.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
A61B 6/58 (2013.01); A61B 6/037 (2013.01); A61B 6/4275 (2013.01); G01T 1/2985 (2013.01);
Abstract
In a gamma-ray detector system, such as a PET detector, coincidence events between multiple detector elements can be caused by inter-detector scattering and/or energy escape of the multi-stage radiation background in the scintillator crystals. Because these types of coincidence events are more likely to happen between nearby elements, they can be measured, analyzed and ultimately used to identify arrangement errors of detector elements in a gamma-ray detector system.