The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2024

Filed:

Sep. 21, 2018
Applicants:

Mor Research Applications Ltd., Tel-Aviv, IL;

Ramot AT Tel-aviv University Ltd., Tel-Aviv, IL;

Inventors:

Amir Glik, Tel Aviv, IL;

Miriam Furst-Yust, Tel Aviv, IL;

Felix Benninger, Tel Aviv, IL;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/369 (2021.01); A61B 5/00 (2006.01); A61B 5/16 (2006.01);
U.S. Cl.
CPC ...
A61B 5/369 (2021.01); A61B 5/165 (2013.01); A61B 5/4088 (2013.01); A61B 5/4842 (2013.01); A61B 5/7275 (2013.01);
Abstract

Using microstate data to evaluate Alzheimer's disease including dementia and/or mild cognitive impairment and/or depression and optionally provide treatment based on the diagnosis and/or modify treatment and/or diagnosis based on response to treatment, optionally as measured using microstate data. In one example, the method includes analyzing EEG data to generate one or more EEG parameter; and generating a risk for one or both of depression and MCI (mild cognitive impairment) based on said one or more EEG parameters. Optionally, the disease comprises MCI. Optionally, the disease comprises depression. Optionally, the one or more EEG parameter comprises a microstate-derived parameter. Optionally, the one or more EEG parameter comprises a microstate duration derived parameter.


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