The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Mar. 09, 2020
Applicant:

Lg Electronics Inc., Seoul, KR;

Inventors:

Oanyong Lee, Seoul, KR;

Sunghoon Jung, Seoul, KR;

Sangwon Kim, Seoul, KR;

Assignee:

LG ELECTRONICS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04B 17/318 (2015.01); H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
H04W 36/0094 (2013.01); H04B 17/318 (2015.01); H04W 24/10 (2013.01); H04W 36/0058 (2018.08);
Abstract

The present disclosure relates to method and apparatus for performing a measurement wireless communications. According to an embodiment of the present disclosure, a method performed by a wireless device comprises: receiving measurement configurations from a network, each of the measurement configurations mapping to a corresponding signal quality range; measuring a first signal quality for a serving cell at a first time point and a second signal quality for the serving cell at a second time point after the first time point; identifying a signal quality range to which a difference between the first signal quality and the second signal quality belongs; and performing a measurement based on a measurement configuration mapped to the identified signal quality range.


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