The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Jun. 20, 2022
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Yujin Sin, Hwaseong-si, KR;

Jun-Young Ko, Seoul, KR;

Tae-Ho Kim, Seoul, KR;

Eunsol Seo, Yongin-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G09G 2360/14 (2013.01);
Abstract

A noise measurement device for measuring noise of a test image displayed on a display device including a display panel and an input sensor configured to sense an external input, includes a luminance meter, a converter, and a determiner. The luminance meter is configured to: measure a luminance of the test image in a state in which the input sensor is turned on to generate first luminance measurement values; and measure a luminance of the test image in a state in which the input sensor is turned off to generate second luminance measurement values. The converter is configured to apply a contrast sensitivity function to luminance difference values between the first and second luminance measurement values to generate final conversion values. The determiner is configured to compare the final conversion values with a predetermined reference range to determine whether a defect exists in the test image.


Find Patent Forward Citations

Loading…