The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Dec. 27, 2023
Applicant:

Tongji University, Shanghai, CN;

Inventors:

Yu Tian, Shanghai, CN;

Jianming Ling, Shanghai, CN;

Hongduo Zhao, Shanghai, CN;

Xindong Zhao, Shanghai, CN;

Le Liu, Shanghai, CN;

Jinyu Wu, Shanghai, CN;

Assignee:

TONGJI UNIVERSITY, Shanghai, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 5/00 (2006.01); G08G 5/00 (2006.01);
U.S. Cl.
CPC ...
G08G 5/0086 (2013.01); G01M 5/0066 (2013.01); G01M 5/0091 (2013.01);
Abstract

The present disclosure relates to a method and system for pavement structural performance evaluation based on long-range laser vibration measurement. The method can more accurately evaluate the structural performance of the pavement by detecting the actual deflection value of the pavement during aircraft operation; By obtaining real-time deflection data of the airport runway, it is possible to detect changes in the structural performance of the airport runway in the long term without affecting the normal operation of the airport runway. The present invention has strong anti-interference ability, stable detection results, and can achieve non-contact, large-scale, and high-precision measurement of airport pavement deflection.


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