The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Apr. 05, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Jianquan Liu, Tokyo, JP;

Junnan Li, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06V 10/7747 (2022.01); G06T 7/70 (2017.01); G06T 2207/20081 (2013.01);
Abstract

The present invention provides a processing system () including: a sample image generation unit () that generates a plurality of sample images being each associated with a partial region of a first image generated using a first lens; an estimation unit () that generates an image content estimation result indicating a content for each of the sample images using an estimation model generated by machine learning using a second image generated using a second lens differing from the first lens; a task execution unit () that estimates a relative positional relationship of a plurality of the sample images in the first image; a determination unit () that determines whether an estimation result of the relative positional relationship is correct; and a correction unit () that corrects a value of a parameter of the estimation model when the estimation result of the relative positional relationship is determined to be incorrect.


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