The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Jul. 27, 2021
Applicant:

GE Precision Healthcare Llc, Milwaukee, WI (US);

Inventors:

Ludovic Boilevin Kayl, Versailles, FR;

Fabio Mattana, Versailles, FR;

Vincent Jonas Bismuth, Paris, FR;

Romain Brevet, Versailles, FR;

Fanny Patoureaux, Beynes, FR;

Assignee:

GE PRECISION HEALTHCARE LLC, Milwaukee, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/37 (2017.01); G21K 1/02 (2006.01);
U.S. Cl.
CPC ...
G06T 7/37 (2017.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G21K 1/025 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30068 (2013.01); G06T 2207/30112 (2013.01); G06T 2207/30242 (2013.01);
Abstract

Various methods and systems are provided for x-ray imaging. In one embodiment, a method includes acquiring, with an x-ray detector, an x-ray image of a subject, determining a transformation that minimizes anti-scatter grid artifacts in the x-ray image, correcting the x-ray image according to the transformation to generate a corrected image, and outputting the corrected image. In this way, artifacts arising from a misalignment of an anti-scatter grid between the calibration and the acquisition may be reduced.


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