The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Oct. 26, 2021
Qualcomm Incorporated, San Diego, CA (US);
Jamie Menjay Lin, San Diego, CA (US);
Jisoo Jeong, San Diego, CA (US);
Fatih Murat Porikli, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Systems and techniques are described for performing supervised learning (e.g., semi-supervised learning, self-supervised learning, and/or mixed supervision learning) for optical flow estimation. For example, a method can include obtaining an image associated with a sequence of images and generating an occluded image. The occluded image can include at least one of the image with an occlusion applied to the image and a different image of the sequence of images with the occlusion applied. The method can include determining a matching map based at least on matching areas of the image and the occluded image and, based on the matching map, determining a loss term associated with an optical flow loss prediction associated with the image and the occluded image. The loss term may include a matched loss and/or other loss. Based on the loss term, the method can include training a network configured to determine an optical flow between images.