The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Dec. 13, 2021
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Rajeswaran Chockalingapuramravindran, San Diego, CA (US);

Kristopher Urquhart, Poway, CA (US);

Jamie Menjay Lin, San Diego, CA (US);

Risheek Garrepalli, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/215 (2017.01);
U.S. Cl.
CPC ...
G06T 7/215 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A computer-implemented method includes receiving a first input. The first input is interpolated based on a first shift along a first dimension and a second shift along a second dimension. A first output is generated based on the interpolated first input. The first output corresponds to a vectorized bilinear shift of the first input for use in place of grid sampling algorithms.


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Chockalingapuramravindran, Rajeswaran. (2024). Vectorized bilinear shift for replacing grid sampling in optical flow estimation (U.S. Patent No. 12039740). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12039740

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