The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Feb. 12, 2020
Osaka University, Osaka, JP;
Kazuaki Nakane, Osaka, JP;
Hirofumi Yamamoto, Osaka, JP;
Sachiko Nankumo, Osaka, JP;
Yasuyoshi Tsutsumi, Yamaguchi, JP;
OSAKA UNIVERSITY, Osaka, JP;
Abstract
By analyzing an image of a cell sample, whether a cell shown in the image is cancerous or not, the type of cancer, etc. are objectively and appropriately determined. An image analyzing device () includes: a binarizing section () which carries out a binarizing process a plurality of times with respect to a single captured image so as to generate a plurality of binarized images, the binarizing section carrying out the binarizing process each time the binarizing section varies a binarization reference value; a Betti number calculating section () which calculates a region number, which indicates the number of hole-shaped regions, with respect to each of the plurality of binarized images which have been generated; and a cancer determining section () which determines a type of cancer occurring in a cell included in tissue, on the basis of the binarization reference value which has been applied at a time of generation of one of the plurality of binarized images with respect to which one the region number has a given value.