The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Mar. 17, 2020
Hkc Corporation Limited, Shenzhen, CN;
Chongqing Hkc Optoelectronics Technology Co., Ltd., Chongqing, CN;
Wenqin Zhao, Chongqing, CN;
HKC CORPORATION LIMITED, Shenzhen, CN;
CHONGQING HKC OPTOELECTRONICS TECHNOLOGY CO., LTD., Chongqing, CN;
Abstract
This application discloses an inspection method and an inspection machine for a display panel. The inspection method includes the steps of: taking a picture of a to-be-inspected display panel to obtain a to-be-inspected image of the to-be-inspected display panel; removing high-frequency information in the to-be-inspected image to obtain a high-frequency-removed image; calculating a difference between the to-be-inspected image and the high-frequency-removed image to obtain a difference image; making a determination regarding the difference image by comparing the difference image with a preset threshold, determining that the display panel fails the inspection if the difference image exceeds the preset threshold, and determining that the display panel passes the inspection if the difference image does not exceed the preset threshold.