The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

May. 19, 2020
Applicant:

D-wave Systems Inc., Burnaby, CA;

Inventor:

Jack R. Raymond, Vancouver, CA;

Assignee:

D-WAVE SYSTEMS INC., Burnaby, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/01 (2023.01); G01R 29/26 (2006.01); G01R 33/24 (2006.01); G06N 10/00 (2022.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G06N 7/01 (2023.01); G01R 29/26 (2013.01); G01R 33/24 (2013.01); G06N 10/00 (2019.01); B82Y 35/00 (2013.01);
Abstract

Calibration techniques for devices of analog processors to remove time-dependent biases are described. Devices in an analog processor exhibit a noise spectrum that spans a wide range of frequencies, characterized by 1/f spectrum. Offset parameters are determined assuming only a given power spectral density. The algorithm determines a model for a measurable quantity of a device in an analog processor associated with a noise process and an offset parameter, determines the form of the spectral density of the noise process, approximates the noise spectrum by a discrete distribution via the digital processor, constructs a probability distribution of the noise process based on the discrete distribution and evaluates the probability distribution to determine optimized parameter settings to enhance computational efficiency.


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