The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Aug. 23, 2021
Splunk Inc., San Francisco, CA (US);
Fang I. Hsiao, Berkeley, CA (US);
Ai-chi Lu, San Francisco, CA (US);
Nicholas Matthew Tankersley, Seattle, WA (US);
Splunk Inc., San Francisco, CA (US);
Abstract
Data intake and query system (DIQS) instances supporting applications including lower-tier, focused, work group oriented applications may be tailored to meet the specific needs of the users. Rather than offer pre-configured options, the DIQS-based application offers the user the ability to customize data collection before deploying the collectors for specified host entities within an IT environment. Once the user selects the metrics and/or log sources for data collection at a custom interface, the lower-tier DIQS generates custom script operable to establish collection of the source data having the selected metrics and events associated with selected log sources from the specified host entities. The user can display and analyze the collected data.