The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Jun. 29, 2022
Applicant:

Samsung Sds Co., Ltd., Seoul, KR;

Inventors:

Hyung Suk Moon, Seoul, KR;

Hee Cheol Park, Seoul, KR;

Yoon Chan Jhi, Seoul, KR;

Jong Hwan Lee, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 8/34 (2018.01);
U.S. Cl.
CPC ...
G06F 8/34 (2013.01);
Abstract

A code inspection interface providing method according to an embodiment of this disclosure includes providing a graphical user interface (GUI) for performing code inspection, executing an analysis routine on an inspection target code when the inspection target code is selected through the GUI, and providing the result of executing the analysis routine. The analysis routine may include an operation of extracting an abstract syntax tree includes a plurality of nodes from the inspection target code. A code inspection interface providing method is capable of providing an interface that can analyze a code and detect a security vulnerability in real time regardless of the language version of the code and an apparatus for implementing the method.


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