The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Sep. 30, 2021
Applicant:

Intuit Inc., Mountain View, CA (US);

Inventors:

Noah Eyal Altman, Rishon Le'Zion, IL;

Yair Horesh, Kfar-Saba, IL;

Yaakov Tayeb, Tzur Hadasa, IL;

Assignee:

INTUIT INC., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/279 (2020.01); G06F 16/35 (2019.01); G06Q 30/0201 (2023.01); G06Q 40/02 (2023.01); G06Q 40/12 (2023.01);
U.S. Cl.
CPC ...
G06F 40/279 (2020.01); G06F 16/353 (2019.01); G06Q 30/0201 (2013.01); G06Q 40/02 (2013.01); G06Q 40/12 (2013.12);
Abstract

Certain aspects of the present disclosure provide techniques for generating a metric, include receiving a rule defining one or more text strings; determining a set of transactions based on a user attribute; determining a first subset of transactions; determining a second subset of transactions; generating a first categorical distribution based on each transaction of the first subset of transactions being associated with a transaction description containing at least one text string of the one or more text strings; calculating a first unity metric based on the first categorical distribution; generating a second categorical distribution based on each transaction of the second subset of transactions being associated with a transaction description that does not contain a text string of the one or more text strings; calculating a second unity metric based on the second categorical distribution; determining a reliability metric for the rule; and providing the reliability metric.


Find Patent Forward Citations

Loading…