The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Jan. 24, 2022
Applicant:

Sap SE, Walldorf, DE;

Inventor:

Rahul Tiwari, Bengaluru, IN;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/62 (2013.01);
U.S. Cl.
CPC ...
G06F 21/6218 (2013.01);
Abstract

A computer implemented method can receive a metadata definition of a restricted measure pertaining to a database including a plurality of database tables. The restricted measure has a label, and the metadata definition includes one or more filter criteria configured to filter values contained in the plurality of database tables. In a report designer user interface for a report, the method can present the label of the restricted measure as an option based on the metadata definition. The method can receive a selection of the label of the restricted measure in the report designer user interface. Responsive to the selection, the method can link the metadata definition of the restricted measure to the report. When generated, the report requests access to the values contained in the plurality of database tables via application of the one or more filter criteria of the metadata definition.


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