The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Jan. 29, 2021
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Jay A. Pathak, Newark, CA (US);

Steve Yu Zhang, San Francisco, CA (US);

Assignee:

SPLUNK INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2455 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2455 (2019.01); G06F 16/2228 (2019.01);
Abstract

A computer-implemented method of determining indexed fields at query time comprises mapping data from a first source type to indexed fields in batch form using a wildcard specifier. The method also comprises receiving a query to execute on a data set comprising data from the first source type and data from a second source type. Further, the method comprises transforming the query to execute on the data from the first source type separately from the data from the second source type. Additionally, the method comprises executing the query to operate on the data from the first source type using information associated with the indexed fields and to separately operate on the data from the second source type.


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