The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Apr. 15, 2022
Applicant:

Pratt & Whitney Canada Corp., Longueuil, CA;

Inventors:

Changsheng Guo, South Windsor, CT (US);

Serafettin Engin, Brossard, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/4097 (2006.01); G05B 19/4093 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4097 (2013.01); G05B 19/40937 (2013.01); G05B 19/41875 (2013.01); G05B 2219/32368 (2013.01);
Abstract

A method for qualifying a manufacturing process for a first component including a common geometric feature includes obtaining manufacturing data for the common geometric feature. The manufacturing data is associated with one or more qualified second components. The one or more qualified second components are different than the first component. Each of the one or more qualified second components include the common geometric feature. The method further includes modeling the manufacturing process for the common geometric feature of the one or more qualified second components using the manufacturing data, modeling the manufacturing process for the common geometric feature of the first component, obtaining manufacturing process parameters for the manufacturing process for the common geometric feature of the one or more qualified second components, and qualifying the manufacturing process for the common geometric feature of the first component.


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