The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Jul. 08, 2021
Leica Microsystems Cms Gmbh, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope includes: an optical system including an immersion objective for an immersion medium of a predetermined refractive index; an aperture stop; and a processor for setting an immersion-free imaging mode in which the optical system is operated without immersion medium. The processor controls the aperture stop in the immersion-free imaging mode to set a numerical aperture of the immersion objective to a reduced value which is lower than a nominal value of the numerical aperture, the numerical aperture being equal to the nominal value when the optical system is operated using the immersion medium without reducing the numerical aperture by the aperture stop. The processor controls the optical system in accordance with the reduced value of the numerical aperture in the immersion-free imaging mode to generate at least one image representing the overview image of the sample.