The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Sep. 04, 2019
Applicants:

Sorbonne Université, Paris, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

École Normale Supérieure DE Paris, Paris, FR;

Inventors:

Sylvain Gigan, Paris, FR;

Thomas Juffmann, Vienna, AT;

Andrés De Los Ríos Sommer, Tlalpan, MX;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/14 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/14 (2013.01); G02B 21/365 (2013.01);
Abstract

A device for phase microscopy is disclosed that comprises a spatial light modulator and a connecting means adapted to fix the spatial light modulator onto a phase microscope. The phase microscope comprises a light path comprising at least a sample area, a light device for lighting said sample area, and an imaging device for capturing a phase image of said sample area. The phase image is a 2D matrix of pixels. The spatial light modulator is positioned in the light path in a conjugated plane of the sample area. The device also comprises a command of the spatial light modulator connected to the imaging device and adapted to measure the phase shift of a plurality of pixels of the phase image and to command the spatial light modulator in order to subtract the measured phase shifts.


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