The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Dec. 15, 2021
Harbin Institute of Technology, Harbin, CN;
HARBIN INSTITUTE OF TECHNOLOGY, Harbin, CN;
Abstract
The disclosure discloses a stress gradient high-efficiency non-destructive detection system based on frequency domain calculation of broadband swept frequency signals, and a detection method thereof. The detection method includes: step 1: calibrating an LCR wave velocity of an object to be measured; step 2: calculating a starting frequency and a cut-off frequency of broadband swept frequency signals based on the LCR wave velocity of the object to be measured in the step 1 and a stress gradient measuring range in a depth direction of the object to be measured; step 3: converting phase delay to time delay information based on the phase delay of the starting frequency and the cut-off frequency in the step 2; and step 4: determining stresses of depths corresponding to different frequency components based on the time delay information in the step 3 to finally realize layer-by-layer scanning of stresses at different depths of the measured object. The disclosure is used to solve the problem of low stress gradient measuring accuracy, and realize the high-efficiency characterization of the stress gradient in the depth direction.