The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Jul. 26, 2021
Applicant:

Wyatt Technology, Llc, Goleta, CA (US);

Inventors:

Daniel I. Some, Atlit, IL;

Michael I. Larkin, Santa Barbara, CA (US);

Assignee:

Wyatt Technology, LLC, Goleta, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
G01N 21/47 (2013.01); G01N 2021/0143 (2013.01); G01N 2021/4711 (2013.01);
Abstract

The present disclosure describes a computer implemented method, a system, and a computer program product of purifying a sample solution via real-time multi-angle light scattering. In an embodiment, the method, system, and computer program product include receiving from a MALS instrument baseline scattering intensity values of a pure buffer, receiving from the MALS instrument scattering intensity values of a sample solution, and characterizing at least one component of the sample solution, resulting in a time series of values of a dimension, D, of the at least one component and a time series of values of excess Rayleigh ratio, R0, of the at least one component, and determining that the values of the dimension, D, fall within a dimension, D, value range and that the values of excess Rayleigh ratio, R0, fall within an excess Rayleigh ratio value range, and transmitting a collect sample solution command to collect the sample solution.


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