The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

May. 21, 2021
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

So Hee Kim, Seoul, KR;

Jihyun Hong, Seoul, KR;

Jae Pyoung Ahn, Seoul, KR;

Inyeong Kang, Seoul, KR;

Woo Suk Baek, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); G01N 1/28 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 1/286 (2013.01); G01N 35/00029 (2013.01); G01N 2035/00059 (2013.01);
Abstract

There are provided a vacuum transfer system installed in an microscope to prevent oxidation of a sample and a sample measurement method using the vacuum transfer system. The vacuum transfer system according to an embodiment is a vacuum transfer system installed in an microscope to prevent oxidation of a sample, and includes a housing having an open surface, wherein the surface has a coupling element for attaching or detaching to/from the microscope, and an inside of the housing is kept closed from outside as the housing is coupled with the microscope through the coupling element, a gas inlet through which an inert gas is introduced into the housing, a gas outlet through which an active gas in the housing exits with the introduction of the inert gas into the housing, and at least one glove formed to be connected with the inside of the housing.


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