The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2024

Filed:

Mar. 03, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Toshio Miyake, Shiojiri, JP;

Haruki Miyasaka, Matsumoto, JP;

Kenichi Furuya, Shiojiri, JP;

Hisayuki Akahane, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/51 (2006.01); G01D 5/14 (2006.01); G01J 3/02 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01J 3/51 (2013.01); G01D 5/14 (2013.01); G01J 3/0232 (2013.01); G01J 3/50 (2013.01);
Abstract

A color measurement apparatus includes an opening portion that is formed in an opening portion forming member arranged in a bottom portion of the apparatus and causes light arriving from a measurement target to enter inside the apparatus, a light emission portion that emits light for measurement toward the measurement target, and a shutter unit that is configured to switch between a closed state in which the opening portion is covered, and an open state in which the opening portion is open, and that has a reflection reference surface at a position facing the opening portion in the closed state as a reference of reflectance, in which the shutter unit is disposed such that the shutter unit is configured to switch to, in addition to the closed state and the open state, an exposed state in which the reflection reference surface is exposed outside the apparatus.


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