The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Jul. 25, 2018
Obayashi Corporation, Tokyo, JP;
Yuichi Ikeda, Tokyo, JP;
Tamaki Horii, Tokyo, JP;
Kazuyuki Goto, Tokyo, JP;
Hidefumi Takenaka, Tokyo, JP;
Takayuki Yamamoto, Tokyo, JP;
OBAYASHI CORPORATION, Tokyo, JP;
Abstract
An inspection processing system identifies a current position, obtains an inspection result of an inspection subject of a structure on the current position, and records the inspection result in association with the position of the inspection subject in a three-dimensional model of the structure. The inspection processing system further identifies a user who views the three-dimensional model and a current position, and outputs, to an output unit, an inspection result in which the user is recorded in an inspection information memory as a related person of the inspection subject. The inspection result is attached on a virtual image according to a three-dimensional model corresponding to the current position.