The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Dec. 13, 2021
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Hirotsugu Kawanaka, Tokyo, JP;
Hyakka Nakada, Tokyo, JP;
Noboru Saitou, Tokyo, JP;
Shinji Matsushita, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B22F 10/80 (2021.01); B33Y 50/00 (2015.01); G05B 19/4099 (2006.01);
U.S. Cl.
CPC ...
B22F 10/80 (2021.01); B33Y 50/00 (2014.12); G05B 19/4099 (2013.01); G05B 2219/49023 (2013.01);
Abstract
A search apparatus includes a processor and a memory. The processor receives a molding result of a reference sample manufactured by the additive manufacturing apparatus. The processor calculates predicted values from a predictive model. The processor determines whether the evaluation target values are achieved by the measured values. The reference sample has at least three smooth surfaces and a surface having aggregated punched holes formed by straight lines and curved lines that are involved in three types of regions to be set as the conditions.