The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2024
Filed:
Jan. 25, 2019
Applicant:
Osaka University, Osaka, JP;
Inventors:
Kohji Nishida, Osaka, JP;
Kazuichi Maruyama, Osaka, JP;
Noriyasu Hashida, Osaka, JP;
Reiko Kobayashi, Osaka, JP;
Assignee:
OSAKA UNIVERSITY, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 5/16 (2006.01);
U.S. Cl.
CPC ...
A61B 3/14 (2013.01); A61B 3/102 (2013.01); A61B 5/165 (2013.01);
Abstract
A method for detecting a stressed state, including a step of detecting a stressed state of a subject based on a tomographic image of a choroid of the subject, and a stress detection apparatus including: an image acquisition unit that acquires a tomographic image of a choroid of a subject; a calculation unit that calculates a choroidal thickness or a volume of the choroid based on the tomographic image; and a detection unit that detects a stressed state of the subject based on the choroidal thickness or the volume of the choroid.