The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Aug. 15, 2022
Applicant:
Ramona Optics Inc., Durham, NC (US);
Inventors:
Jaehee Park, Durham, NC (US);
Colin Cooke, Durham, NC (US);
Mark Harfouche, Durham, NC (US);
Gregor Horstmeyer, Durham, ND (US);
Assignee:
Ramona Optics Inc., Durham, NC (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 23/90 (2023.01); G01N 21/21 (2006.01); G02B 21/06 (2006.01); G02B 21/36 (2006.01); H04N 5/265 (2006.01); H04N 23/56 (2023.01); H04N 23/695 (2023.01);
U.S. Cl.
CPC ...
H04N 23/90 (2023.01); G01N 21/21 (2013.01); G02B 21/06 (2013.01); G02B 21/365 (2013.01); H04N 5/265 (2013.01); H04N 23/56 (2023.01); H04N 23/695 (2023.01); G01N 2021/216 (2013.01);
Abstract
A system and method for high-resolution polarimetric imaging can include an array of micro-cameras to simultaneously capture polarized optical information from a wide area. Polarized illumination sources can be placed below and/or above the sample to direct polarized light to the sample during image capture. Post processing can be performed on the captured images to obtain polarimetric properties of the sample.