The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Dec. 22, 2021
Panduit Corp., Tinley Park, IL (US);
Jose M. Castro, Naperville, IL (US);
Richard J. Pimpinella, Frankfort, IL (US);
Bulent Kose, Burr Ridge, IL (US);
Yu Huang, Orland Park, IL (US);
Fei Jia, Tinley Park, IL (US);
Panduit Corp., Tinley Park, IL (US);
Abstract
A test apparatus has at least one optical source, a high-speed photodetector, a microcontroller or processor, and electrical circuitry to power and drive the at least one optical source, photodetector, and microcontroller or processor and for measuring the frequency response of a multimode optical fiber under test. The test apparatus can utilize an optical pulse waveform with a light adapter to measure of the channel under test. It can also uses a correction method to de-embed a chromatic bandwidth of the source from the encircled flux modal chromatic bandwidth. The correction method can use correction functions obtained for different type of VCSELs to estimate the optical channel bandwith when used with VCSEL transceivers.