The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Mar. 27, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Akira Hirokawa, Tokyo, JP;

Tatsuya Shimahara, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/12 (2022.01); G06T 5/00 (2024.01); G06T 5/80 (2024.01); G06V 10/80 (2022.01);
U.S. Cl.
CPC ...
G06V 40/1359 (2022.01); G06T 5/80 (2024.01); G06V 10/806 (2022.01); G06T 2207/20044 (2013.01);
Abstract

A stripe pattern image collating device according to the example embodiment includes a feature extracting unit that extracts a feature point and a skeleton from a first stripe pattern image and a second stripe pattern image in which a stripe pattern is formed of ridges, and generates feature point data and skeleton data. A skeleton collating unit that collates two sets of pieces of the feature point data and pieces of the skeleton data that are extracted from each of the first stripe pattern image and the second stripe pattern image, and calculates a collation score. An image analyzing unit that analyzes the second stripe pattern image with respect to an area in which an opposite feature point pair of the first stripe pattern image exists, calculates an image analysis score, and corrects the collation score.


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