The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Apr. 07, 2023
Applicant:

X Development Llc, Mountain View, CA (US);

Inventors:

Vadim Tschernezki, Schonefeld, DE;

Lance Co Ting Keh, La Crescenta, CA (US);

Hongxu Ma, Mountain View, CA (US);

Allen Richard Zhao, Mountain View, CA (US);

Jie Jacquot, San Carlos, CA (US);

Assignee:

X Development LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/64 (2022.01); G06F 18/214 (2023.01); G06F 18/2413 (2023.01); G06N 3/08 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06V 20/64 (2022.01); G06F 18/214 (2023.01); G06F 18/2413 (2023.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01);
Abstract

Methods, systems, and apparatuses, including computer programs encoded on a computer storage medium, for machine learning classification based on separate processing of multiple views. In some implementations, a system obtains image data for multiple images showing different views of an object. A machine learning model is used to generate a separate output based on each the multiple images individually. The outputs for the respective images are combined to generate a combined output. A predicted characteristic of the object is determined based on the combined output. An indication of the predicted characteristic of the object is provided.


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