The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2024

Filed:

Dec. 14, 2021
Applicant:

Mobileye Vision Technologies Ltd., Jerusalem, IL;

Inventor:

Gabriel Bowers, Jerusalem, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/56 (2022.01); B60W 60/00 (2020.01); G06T 3/4053 (2024.01); G06T 7/194 (2017.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06V 20/56 (2022.01); G06T 3/4053 (2013.01); G06T 7/194 (2017.01); G06T 7/90 (2017.01); B60W 60/001 (2020.02); B60W 2420/403 (2013.01);
Abstract

Techniques are disclosed for generating a two-dimensional (2D) map of signal-to-noise ratio (SNR) values for sensor-acquired images. The techniques leverage the use of lookup tables (LUTs) to generate a transformation LUT that functions to map pixel values to SNR values. The transformation LUT may be generated by first generating an intermediate LUT that uses the operating parameters identified with the sensor to map pixel values to light level values. The light level values are then used together with an SNR model that outputs a prediction of electrons identified with a signal portion and a noise portion of images acquired by the sensor to thus map the pixel values to SNR values. The 2D map may be used to improve upon the accuracy of the classification of objects and/or scene characteristics for various applications.


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