The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Jun. 08, 2020
The Research Foundation for the State University of New York, Albany, NY (US);
Fazel A. Khan, East Setauket, NY (US);
Imin Kao, Stony Brook, NY (US);
Carlos Gabriel Helguero, Guayaquil, EC;
The Research Foundation for The State University of New York, Albany, NY (US);
Abstract
A method for identifying one or more fractures in a digitized x-ray image includes: obtaining a digitized x-ray image; performing preprocessing on the digitized x-ray image to generate a modified x-ray image having enhanced resolution; partitioning the modified x-ray image into a two-dimensional array including multiple pixels; obtaining an intensity of each of the pixels in the modified x-ray image; evaluating each of the pixels in the modified x-ray image to determine whether at least a given one of the pixels has an intensity indicative of a black pixel; for each given pixel having an intensity indicative of a black pixel, flagging the given pixel when pixels immediately adjacent to the given pixel have an intensity greater than a prescribed threshold value; and placing a visual indication of a possible fracture on the modified x-ray image corresponding to a location of each flagged pixel.