The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Jan. 28, 2021
Olympus Corporation, Hachioji, JP;
Steven Paul Lansel, East Palo Alto, CA (US);
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A method for evaluating an external machine learning program while limiting access to internal training data includes providing labeled training data from a first source, receiving, by the first source, a machine learning program from a second source different from the first source, blocking, by the first source, access by the second source to the labeled training data, and training, by the first source, the machine learning program according to a supervised machine learning process using the labeled training data. The method further includes generating a first set of metrics from the supervised machine learning process that provide feedback about training of the neural network model, analyzing the first set of metrics to identify subset data therein, and, in order to permit evaluation of the neural network model, transmitting, to the second source, those metrics from the first set of metrics that do not include the subset data.