The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2024
Filed:
Jun. 29, 2021
Keysight Technologies, Inc., Santa Rosa, CA (US);
Masaharu Goto, Hanno, JP;
Naoki Kobayashi, Tokyo, JP;
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
A method of analyzing measurement data includes sorting EDSs into similarity clusters including a representative RDS; labeling the similarity clusters; sorting the EDSs or RDSs into sub-clusters; selecting one of the EDSs or RDSs in each of the sub-clusters as a search seed representative of the sub-cluster; sorting measurement EDSs from measurement data into measurement clusters including a representative measurement RDS; determining for each search seed a most similar one of the measurement EDSs or RDSs; identifying the determined most similar one of the measurement EDSs or RDSs for each search seed as a classification segment corresponding to the search seed; sorting new measurement EDSs or RDSs into classification clusters with the classification segments; classifying all the new measurement EDSs or RDSs in each classification cluster the same as the corresponding classification segment; and determining whether patterns of interest are in the measurement data stream based on the classification clusters.